LSR-1 Thermoelectric Material Analyzer｜Integrated Measurement of Seebeck Coefficient, Electrical Resistivity, and ZT Value by the Harman Method

Thermoelectric Material Measurement System — LSR-1 (LSR L32)

1. Instrument Overview

The LSR-1 is a professional thermoelectric material characterization system designed for simultaneous measurement of the Seebeck coefficient and electrical resistivity / conductivity. The standard operating temperature range is from room temperature up to 200°C, with optional extensions to low temperature down to −160°C or high temperature up to 600°C. The system supports vacuum, inert, reducing, and oxidizing atmospheres, making it suitable for a wide range of material research applications. Its compact benchtop design combined with automated control software ensures high usability and stable operation.

2. Measurement Principles

1. Seebeck Coefficient

• The Seebeck coefficient is determined by applying a controlled temperature difference (ΔT) across the sample and measuring the corresponding thermoelectric voltage.
• Linear regression of voltage versus temperature difference is used to calculate the Seebeck coefficient, with a typical measurement time of 30–90 seconds.
• A dual-point temperature and voltage measurement scheme is applied to effectively reduce drift errors.

2. Electrical Resistivity / Conductivity

• The Van der Pauw four-probe method is used, allowing measurement of irregular-shaped bulk samples or thin films.
• Two measurement cycles are performed by alternating current and voltage contacts, and the sheet resistance is calculated using standard equations.
• Bulk resistivity and electrical conductivity are then derived from the measured values.

3. System Features and Advantages

• Simultaneous dual-property measurement: Seebeck coefficient and electrical resistivity are measured at the same time, ensuring high data consistency.
• Modular architecture: Optional modules include low-temperature cooling, gas control, optical windows, and illumination units.
• Sealed chamber design: Supports vacuum operation and flexible switching between different gas atmospheres.
• Fully automated measurement software: Provides data quality checks, graphical analysis, and export to Excel or ASCII formats.
• Benchtop design: Enables easy sample mounting and fast experimental workflow.

4. Key Technical Specifications

• Temperature range: RT ~ 200°C (optional: −160°C ~ 600°C)
• Seebeck measurement range: 0 ~ 2.5 mV/K
• Maximum temperature difference ΔT: ≤ 10 K
• Thermoelectric voltage range: ±8 mV, resolution 0.5 nV
• Sample size (Seebeck): L 8–25 mm / W 2–25 mm / thickness ≤ 2 mm
• Sample size (resistivity): L/W 18–25 mm / thin film up to 2 mm
• Minimum resistance range: 10 nΩ
• Heating rate: 0.01–100 K/min
• Temperature accuracy: ±1.5°C or 0.0040 × |T|

5. Application Fields

• Thermoelectric performance studies of metals, semiconductors, and composite materials.
• Material development and efficiency evaluation from low to medium-high temperatures.
• Material optimization, grain boundary engineering, thin-film processing, and composition tuning.
• R&D, quality control, and structure–property correlation studies.

Video: LSR-1 Demonstration Video (YouTube)