SEM Scanning Electron Microscope
• Resolution: 5 nm
• SE Imaging at 30 kV
• Electron Gun:
Tungsten (W) Filament
• Accelerating Voltage: 1–30 kV
• Magnification: up to 200,000×
• Detectors: SE / BSE
• SE Imaging at 30 kV
• Electron Gun:
Tungsten (W) Filament
• Accelerating Voltage: 1–30 kV
• Magnification: up to 200,000×
• Detectors: SE / BSE
CONTACT Commissioned Measurement & Calibration Service – Contact Information
ServicesLucas Lu
Mobile: 0900-616-157
Email: Lucas.Lu@fstintl.com.tw
Email: Lucas.Lu@fstintl.com.tw
Sales Lio Chiu
Mobile: 0989-344-921
Email: lio.chiu@fstintl.com.tw
Email: lio.chiu@fstintl.com.tw