PLH Thermal Conductivity Analyzer (Thin-Film Measurement in the µm Range)

PLH Micrometer-Scale Thin-Film Thermal Conductivity Analyzer: Precision Measurement Solution for High Thermal Resistance Materials

The PLH is a thermal conductivity analysis platform specifically designed for micrometer-scale thin films and high thermal resistance materials. It enables precise measurement of thermal conductivity and thermal resistance, making it particularly suitable for evaluating the thermal performance of micro-structured materials such as thermal films, insulating layers, and multilayer stacks used in the electronics industry. The system is based on a steady-state one-dimensional heat conduction model, providing stable and traceable thermal property data.

Key Features

Ultra-thin sample capability: Supports thermal conductivity measurements for thin films down to a few micrometers.
High-sensitivity measurement: Equipped with high-precision thermocouples and a temperature-controlled platform to enhance resolution.
Standardized clamping design: Based on a steady-state heat flow model to minimize errors caused by boundary effects.
Programmable temperature control: From room temperature up to 300°C, enabling analysis of temperature-dependent material behavior.
Automated data analysis: Automatic calculation of thermal resistance and thermal conductivity to accelerate result generation.
Multilayer structure analysis: Capable of resolving the thermal contribution of individual layers in composite stacks.

Application Areas

Semiconductor packaging: Thermal resistance analysis of insulating layers, thermal barrier films, and interface materials.
MEMS devices: Investigation of heat transfer properties in nanostructured and micro-electromechanical materials.
Displays and optoelectronics: Thermal design validation and heat dissipation assessment of thin-film materials.
Materials research: Fundamental thermal property evaluation of high thermal resistance and low thermal conductivity materials.

Technical Specifications (PLH)

Temperature range: Room temperature to 300°C
Heating rate: 0.01 to 20 °C/min
Sample dimensions: Ø 3, 6, 10, 12.7, or 25.4 mm; square 5×5, 10×10, 20×20 mm
Sample thickness: 10 to 500 µm
Automatic sample robot: Supports 3 or 6 samples
Laser source: Continuous-wave diode laser, up to 5 W
Wavelength: 450 nm
Thermal diffusivity range: 0.01 to 2000 mm²/s (depending on sample thickness)
Accuracy: ±5%
Repeatability: ±5%
Instrument dimensions: 550 × 600 × 680 mm (21.6 × 23.6 × 26.7 in)
Applicable standards (LFA): ASTM E1461, DIN 30905, DIN EN 821
Applicable standards (PLH): JIS R 7240:2018, ISO 20007:2017