Veritas Series Benchtop Scanning Electron Microscope (SEM) – Large-Sample Observation System
The Veritas Series benchtop SEM offers excellent large-sample capacity combined with high-resolution imaging performance. Equipped with a five-axis motorized stage, automated image control, and a high-speed vacuum system, it is well suited for a wide range of microscopic analysis applications, including materials science, semiconductors, electronic packaging, nanoparticle analysis, and biological structure observation.
Key Features
- Large sample support: Accommodates samples up to Ø 178 mm × 80 mm in height, ideal for large materials, components, and structural parts.
- High-resolution imaging: 5.0 nm in SE mode and 6.0 nm in BSE mode, revealing fine surface morphology details.
- Five-axis motorized stage: X/Y travel up to 42 mm, Z range 5–53 mm, 360° rotation, and ±90° tilt for flexible multi-angle observation.
- Fully automated image control: Includes Auto Focus, Auto Brightness/Contrast, and Auto Gun Alignment.
- High-efficiency vacuum system: Pump-down time of approximately 90 seconds and venting time of about 10 seconds; the chamber can hold up to three samples simultaneously.
- Compatible with major EDS systems: Supports mainstream EDS systems from Thermo, Oxford, Bruker, EDAX, and others.
Applications
- Semiconductor packaging analysis: Die bonding, micro-crack inspection, and interface observation of packaging materials.
- Materials science: Surface morphology, cross-section analysis, and failure mechanism studies.
- Nanoparticle research: Particle size, morphology, dispersion, and surface structure analysis.
- Biological samples: Insects and tissue surface microstructures (metal coating required).
- Electronic component inspection: PCB, solder joints, MEMS devices, and machined metal parts.
Video: Veritas Series SEM Demonstration