L75 Laser Dilatometer|Ultra-High Resolution Non-Contact Thermal Expansion Testing System
The L75 Laser Dilatometer utilizes laser interferometry technology and delivers an ultra-high resolution of 0.3 nm, making it ideal for precise thermal expansion measurements of low CTE materials and critical semiconductor components. Its non-contact measurement design eliminates mechanical stress on the sample, ensuring excellent accuracy even under high-temperature and high-stability testing conditions.
The system supports multiple atmospheres and a wide temperature range, making it suitable for materials research, quality control, and advanced engineering validation.
Product Overview
The L75 Laser is a high-precision dilatometer specifically designed for ultra-low coefficient of thermal expansion materials. Equipped with a laser optical interferometer, it provides not only extremely high resolution but also absolute measurement capability, allowing reliable results without the need for external calibration standards. This system is particularly suitable for high-precision expansion analysis of quartz glass, ceramics, carbon-based materials, Invar alloys, and semiconductor packaging materials.
Key Features
- Ultra-high resolution of 0.3 nm: More than 30 times higher precision than conventional push-rod dilatometers.
- Flexible sample geometry: No strict shape requirements; suitable for non-standard samples.
- Absolute measurement system: Accurate results without external reference calibration.
- Non-contact optical detection: Eliminates errors caused by contact force, friction, and push-rod deformation.
- Dual temperature configurations: Selectable ranges from -180°C to 500°C or RT to 1000°C.
- Multiple atmosphere capability: Supports inert, oxidizing, reducing, and vacuum environments.
- Wide material compatibility: Ideal for glass, ceramics, quartz, carbon materials, and semiconductor devices.
Applications
- Low CTE materials: Quartz glass, carbon materials, ceramics, glass-ceramics, Invar alloys.
- Semiconductor industry: CTE testing for packaging materials, thermal interface materials, and precision components.
- Quality control: Thermal stability analysis of metal parts, sealants, and engineering materials.
- Research & advanced R&D: Materials science, aerospace, optoelectronics, and defense-related applications.
Technical Specifications
| Item | L75 Laser Specification |
|---|---|
| Temperature Range | -180°C to 500°C / RT to 1000°C (module dependent) |
| Resolution | 0.3 nm |
| Heating / Cooling Rate | 0.01 – 50 K/min |
| Sample Holder | Fused Silica |
| Sample Length | Up to 20 mm |
| Sample Diameter | Up to Ø 7 mm |
| Atmosphere | Inert, oxidizing, reducing, vacuum |
| Interface | USB |
Video
Watch the L75 Laser Demonstration Video (YouTube)
Mobile: 0919-138-108
Mail: Allen.kuo@fstintl.com.tw

