Overview of Thermoelectric Material Analysis Instruments｜ Complete Measurement Solutions for Seebeck Coefficient, Electrical Resistivity, ZT Value, and Hall Coefficient
We provide comprehensive thermoelectric material measurement solutions covering the Seebeck coefficient, electrical resistivity, thermal conductivity, Hall coefficient, and the ZT value. These systems enable researchers to fully evaluate thermoelectric conversion efficiency, charge carrier transport behavior, and energy harvesting potential. Typical applications include waste heat recovery, energy material development, semiconductor processes, and advanced thin-film material research.
Thermoelectric Analysis Instrument Series
TEG-TESTER｜Thermoelectric Generator Module Efficiency Tester
- Main functions: Measurement of efficiency, output power, and load characteristics of thermoelectric generator (TEG) modules at different temperatures.
- Temperature range: RT ~ 300°C / -20 ~ 300°C
- Typical applications: Thermoelectric module development, quality control, and energy conversion system design.
LSR-3｜Electrical Property Analyzer for Thermoelectric Materials
- Main functions: Measurement of Seebeck coefficient and electrical resistivity (or conductivity); suitable for bulk materials and thin films.
- Temperature range: -100 ~ 500°C / RT ~ 800°C / 1100°C / 1500°C
- Typical applications: Thermoelectric material development, electrical property analysis, and laboratory research.
LZT-METER｜Integrated Thermoelectric Performance Analyzer (LFA + LSR)
- Main functions: Integrated measurement of Seebeck coefficient, electrical resistivity, and thermal conductivity for complete determination of the ZT value.
- Temperature range: -100 ~ 500°C / RT ~ 800°C / 1100°C
- Typical applications: High-performance thermoelectric material research, energy material development, and comparative material studies.
HCS Series (1 / 10 / 100)｜Hall Effect and Carrier Property Analyzer
- Main functions: Measurement of carrier concentration, mobility, electrical resistivity, and Hall coefficient.
- Temperature range: LN2 ~ 800°C / RT ~ 500°C
- Typical applications: Semiconductor characterization, electrical property evaluation, and dopant effect studies.
TFA｜Thin-Film Thermoelectric Analyzer (ZT Measurement on Thin Films)
- Main functions: ZT measurement for nano- to micro-scale thin films; optional Hall coefficient, carrier mobility, and carrier concentration analysis.
- Temperature range: -170°C / RT ~ 280°C
- Typical applications: Thin-film thermoelectric materials, interface thermal transport studies, and multilayer structure analysis.
TF-LFA｜Thin-Film Thermal Diffusivity Analyzer (TDTR Technology)
- Main functions: Measurement of thermal diffusivity in nanoscale thin films with capability to analyze heat transport in multilayer structures.
- Temperature range: -100°C / RT ~ 500°C
- Typical applications: Advanced semiconductors, optoelectronic thin films, and thermal management research in stacked structures.
CONTACT
Sales Contact｜Allen Kuo
Thermoelectric Material Analysis / ZT Evaluation Consultation
Mobile: 0919-138-108
Email: Allen.kuo@fstintl.com.tw