CUBE-II Benchtop Scanning Electron Microscope (SEM)
CUBE-II is a high-resolution benchtop scanning electron microscope (SEM) that combines a compact footprint with high-performance imaging capability. Equipped with a five-axis motorized stage, up to 200,000× magnification, and a low-vacuum mode, it is well suited for a wide range of applications including materials science, electronics, life sciences, and educational laboratories.
Key Features
- Five-axis motorized stage: Supports X / Y / Z / Tilt / Rotate, enabling 360° flexible viewing angles.
- High magnification: From 20× to 200,000×, revealing micro- and nanoscale details.
- Automated operation: Auto Focus and Auto Exposure functions for easy and intuitive use.
- Low-vacuum, coating-free mode: Suitable for non-conductive samples without conductive coating.
- Fast image acquisition: Integrated image processing software for rapid generation of high-quality images.
- 15.6-inch touch screen: One-touch operation for quick mode switching and magnification control.
Application Fields
- Materials science: Powders, fibers, and metallic microstructures.
- Electronic component inspection: PCBs, semiconductors, and micro-solder joints.
- Life sciences: Insects, plant tissues, and microbial morphology.
- Education and research: Teaching demonstrations and fundamental materials observation.
Technical Specifications
| Item | Specification |
|---|---|
| Magnification | 20× – 200,000× |
| Resolution | 3.0 nm @ 30 kV |
| Maximum sample size | Ø 70 mm |
| Accelerating voltage | 1 – 30 kV |
| Vacuum mode | High / Low vacuum |
| Stage travel | X / Y / Z / Tilt / Rotate (five-axis) |
Video: CUBE-II SEM Demonstration Video